Thermal Profiler for Solar Cell Manufacturing
Compact — Accurate Ease of Use Graphical Interface
SunKIC Thermal Profiler designed for the Solar Industry
The compact profiler is designed to accommodate height restrictions of metallization furnace tunnels. The hardware and thermal shields are designed to protect the profiler while riding through a metallization furnace with a solar wafer. A single run in a standard wafer firing application will typically increase the SunKIC’s internal temperature by less than 10°C. Repeated runs with brief cool down periods are therefore acceptable. The SunKIC can also be used in other solar applications. Please check with KIC on guidelines for heat protection. The longer duration applications will require the use of trailing TC wires while the profiler stays outside of the heated areas.
The SunKIC provides 20 readings per second for more accurate readings. This is particularly critical in peak zone of the firing profile.
The 4 channel SunKIC utilizes standard type K thermocouple connectors. Standard AAA batteries provide power to the SunKIC. Easy access to the battery compartment allows for quick replacements to ensure availability of your profiler when you need it.
The SunKIC graphically based software automates many of the measurement requirements of older generation profilers. This results in more convenient and quicker profile runs. The software is designed to provide an instant analysis of the profile data.
- Multiple profile overlays
- Zoom-in function
- “Area under the curve” measurements
- Delta measurements between the coldest and hottest TCs
- All statistics displayed on a single page (peak, time above measurements, etc.)
Should the furnace setpoints need to change for whatever reason, the SunKIC software comes standard with a prediction feature that instantly shows the expected change in the wafer profile to changes in the setpoints. This tool can significantly reduce the time it takes an engineer to adjust the furnace setpoints in order to achieve the desired wafer profile.
The Process Window Index is calculated using a formula that includes all statistics for all thermocouples. The formula for the PWI is calculated as follows:
i=1 to N (number of thermocouples)
j=1 to M (number of statistics per thermocouple)
measured_value[i,j]=the [i,j]th statistic’s value
average_limits[i,j]=the average of the [i,j]th statistic’s high and
range[i,j]=the [i,j]th statistic’s high limit minus the low limit
|Minimum Instrument Accuracy:||±0.5°C / ±0.9°F|
|Internal Operating Temp Range:||0°C to 85°C|
|Measurement Temp Range:||-150°C to 1350°C -300°F to 2400°F|
|Sample Rate:||20 per second|
|PC Connection:||USB 2.0 (Std-A/Mini-B)|
|Power Requirements:||(3) AAA batteries|
|Number of Thermocouples:||4|
|Thermocouple Compatibility:||Type K, Standard|
|Dimensions (L x W x H mm):|
|SunKIC Profiler:||212.0 x 68.0 x 14.5|
|Standard Thermal Shield:||330.0 x 74.0 x 19.5|
|SunKIC Profiler:||0.5 kg / 1.1 lbs|
|Standard Thermal Shield:||.1.07 kg / 2.36 lbs|
The Process Window Index for a complete set of profile statistics is calculated as the worst case (highest number) in the set of statistics. For example: if you run a profile with three thermocouples, and four profile statistics are logged for each thermocouple, then there will be a set of twelve statistics for that profile. The PWI will be the worst case (highest number expressed as a percentage) in that set of profile statistics.
Minimum System Requirements
- Dual Core / 1 GHz Processor PC with 2 GB RAM
- 2 GB available storage
- Video 1024 x 768 resolution / 16-bit
- 1 available USB port (for data download)
- 1 available USB port (for software key)
- Microsoft Windows XP, Vista, or 7 (32-bit or 64-bit)