PRESS RELEASEFor Immediate Release

KIC‘s MB (Marybeth) Allen to Present Paper at European Electronics Assembly Reliability Summit, Tallinn

(San Diego, CA -- October 13, 2008) : KIC, the leader of thermal process development and control products and winner of multiple industry awards, announces that MB (Marybeth) Allen is to present a paper at the European and International Electronics Assembly Reliability Summit in Tallinn, Estonia during October 22nd to 24th. The event will be held at the Tallink Spa & Conference Hotel over two days and will be preceded by training workshops from top trainers in their field.

KIC‘s specialist, MB Allen, will present a paper which focuses on ‘Reflow Significance on Package on Package (PoP)‘ on Friday 24th October at 9.30am in Room 2. A design of experiment will be set up to understand the implications of various reflow parameters on the final PoP yield.

More than two years after the RoHS directive first came into force, the technical conference has been set up at a critical time for the electronics industry. With new assembly methods and materials raising reliability issues, the event will provide a unique opportunity to tackle this critical topic through industry discussion, technical collaboration and information sharing.

In addition to KIC Explorer, products include the KIC 24/7 continuous monitoring system, the KIC Vision automatic profiling system and more. With the introduction of cutting edge tools, the company continues to stay on the leading edge of process optimization and real-time thermal management systems, and has won numerous industry awards.


For further information, please contact:

KIC -- Headquarter Office
15950 Bernardo Center Dr #E
San Diego, CA  92127
Tel: +1(858)673-6050
Fax: +1(858)673-0085

Company Contact:   Bjorn Dahle <bjorn@kicmail.com>
Editorial Contact: Allene Bailey <allene@kicmail.com>


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