KIC to Highlight Thermal Process Yield Data Feature at IPC Midwest 2008

(San Diego, CA -- September 1, 2008) : KIC, the leader of thermal process development and control products, and winner of multiple industry awards, announces that it will showcase the newest standard feature of its KIC 24/7 Thermal Management System in booth 301 at the IPC Midwest Conference & Exhibition, scheduled to take place September 24–25, 2008 at the Renaissance Schaumburg Hotel & Convention Center. The new feature focuses on the fundamental responsibility of a reflow oven — to produce each and every product in spec.

Over the last decade, reflow ovens have become much more sophisticated, but still cannot provide the most important information: What is the product profile? Is the profile in spec? How stable is the thermal process? The new KIC 24/7 feature transforms a reflow oven from a black box affair to a transparent process tool.

The KIC 24/7 generates two reports for managers:
A. Defects per million opportunities
B. Reflow process yield

A glance at any of these rolling reports will let managers know the health of their reflow process. The information is instantly understandable without wading through complex reports. Such timely information empowers decision makers to make better production choices that ultimately will lead to improved quality, productivity and, thus, enhanced profitability.

KIC -- Headquarter Office
15950 Bernardo Center Dr #E
San Diego, CA  92127
Tel: +1(858)673-6050
Fax: +1(858)673-0085

Company Contact:   Bjorn Dahle <bjorn@kicmail.com>
Editorial Contact: Allene Bailey <allene@kicmail.com>