KIC Press Release July 10, 2008 - Thermal Process Yield Data Coming to a PC Near You

(San Diego, CA -- July 10, 2008) : KIC, the leader of thermal process development and control products, and winner of multiple industry awards, announces a new standard feature with its KIC 24/7 Thermal Management System. The new feature focuses on the fundamental responsibility of a reflow oven — to produce each and every product in spec.

Over the last decade, reflow ovens have become much more sophisticated, but still cannot provide the most important information: What is the product profile? Is the profile in spec? How stable is the thermal process? The new KIC 24/7 feature transforms a reflow oven from a black box affair to a transparent process tool.

The KIC 24/7 generates two reports for managers:
A. Defects per million opportunities
B. Reflow process yield

A glance at any of these rolling reports will let managers know the health of their reflow process. The information is instantly understandable without wading through complex reports. Such timely information empowers decision makers to make better production choices that ultimately will lead to improved quality, productivity and, thus, enhanced profitability.

About KIC
Based in San Diego, KIC is the industry leader in automated thermal management tools and systems for reflow, wave, cure and semiconductor thermal processes. The company pioneered the development of oven profilers and process development tools, and then worked to create the next generation of thermal systems to help manufacturers optimize and monitor thermal processes.
In addition to KIC Explorer, products include the KIC 24/7 continuous monitoring system, the KIC Vision automatic profiling system and more. With the introduction of cutting edge tools, the company continues to stay on the leading edge of process optimization and real-time thermal management systems, and has won numerous industry awards.